SPECIAL SESSION ON "Dependability, Testing, and Fault Tolerance in Digital Systems (DTFT)"


The Euromicro Conference on Digital System Design (DSD) addresses all aspects of (embedded) digital and mixed hardware/software system engineering. It is a discussion forum for researchers and engineers working on state-of-the-art investigations, developments and applications. It focuses on advanced system design automation concepts, paradigms, methods and tools, as well as modern implementation technologies enabling an effective and efficient development of high-quality systems for demanding applications.

Every designed system has to be tested several times during its life-time - during its design, production, and its in-field operation. The need for testing strictly depends on the actual use of the system, e.g., if the system can be repaired or not, and on the requirements for the system, e.g., if the system must be dependable, fault-tolerant, etc. The design must reflect these requirements. The special session on "Dependability, Testing, and Fault Tolerance in Digital Systems" (DTFT) addresses emerging issues, hot problems, new solution methods and their hardware and software implementations in all fields of digital and analog/mixed-signal system dependability and testing. It is especially focused on testing, dependability, and fault-tolerance of SoC based designs and modern embedded applications.



Authors are encouraged to submit their manuscripts to the Easychair System. Should an unexpected web access problem be encountered, please contact the Program Chair.

Each manuscript should include the complete paper text, all illustrations, and references. The manuscript should conform to the IEEE format: single-spaced, double column, US letter page size, 10-point size Times Roman font, up to 8 pages. In order to conduct a blind review, no indication of the authors' names should appear in the manuscript, references included.

Conference Publishing Services (CPS) will publish accepted papers in the conference proceedings and the proceedings will be submitted to the IEEE Xplore Digital library and indexing services. Extended versions of selected best papers will be published in a special issue of the ISI indexed “Microprocessors and Microsystems: Embedded Hardware Design” Elsevier journal.



H. Kubátová (CTU in Prage, CZ)
Z. Kotásek (BUT, Brno, CZ)


S. Bernard, LIRMM, Montpellier (FR)
Ch. Bolchini, Politechnico di Milano (IT)
A. Bystrov, Newcastle University (UK)
R. Dobai, BUT, Brno (CZ)
A. McEwan, University of Leicester (UK)
G. Fey, Univ. of Bremen (DE)
P. Fišer, CTU in Prague (CZ)
T. Garbolino, Silesian TU, Gliwice (PL)
S. Kajihara, Kyushu Ins. of Tech. (JP)
M. Keim, Mentor Graphics, Wilsonville (US)
Z. Kotásek, BUT, Brno (CZ)
A. Krasniewski, WUT, Warsaw (PL)
H. Kubátová, CTU in Prague (CZ)
I. Levin, Tel Aviv University (IL)
H. Manhaeve, Q-Star Test (BE)
A. Miele, Politecnico di Milano (IT)
G. Di Natale, LIRMM (FR)
A. Orailoglu, UC, San Diego (US)
S. Racek, U. of West Bohemia (CZ)
J. Raik, Tallin U. of Technology (EE)
R. Růžička, BUT, Brno (CZ)
T. Sasao, Meiji University, Kawasaki (JP)
T. Sato, Fukuoka University (JP)
H. Shimada, Nagoya University (JP)
M. Sonza Reorda, Politecnico di Torino (IT)
A. Steininger, Vienna U. of Techn. (AT)
V. Stopjaková, STU, Bratislava (SK)
R. Ubar, TTU, Tallinn (EE)
H. T. Vierhaus, Brandenburg U. Tech. (DE)
Y. Zorian, Virage Logic, CA (US)

Hana Kubátová
Czech Technical University in Prague
Faculty of Information Technology
Department of Digital Design
Thákurova 9, 160 00 Prague 6, Czech Republic
Tel.: +420 224 359 840



Technological Educational Institute of Western Greece